Scanning
Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles
E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael
Hardcover from Kluwer Academic Publishers
Book Published: February, 2003
Microscopy
and Analysis by Peter J. Goodhew, John Humphreys, Richard Beanland, F. J. Humphreys,
R. Beanland
Paperback from Taylor & Francis Group
Book Published: 01 December, 2000